Technical Papers
SOLAR SIMULATION SYSTEMS
A Step by Step Guide to Selecting the “Right” Solar Simulator for Your Solar Cell Testing Application
Mantosh K. Chawla
I-V MEASUREMENT SYSTEMS
Comparison of the Temperature Coefficients of the Basic I-V Parameters for Various Types of Solar Cells
C.R.R. Osterwald, T. Glatfelter and J. Burdick
Advanced System for Calibration and Characterization of Solar Cells
F. Granek and T. Zdanowicz
Applicability of Equivalent Diode Models to Modeling Various Thin-Film Photovoltaic (PV) Modules in a Wide Range of Temperature and Irrandiance Conditions
M. Prorok, B. Werner, T. Zdanowicz
Contacting Bare Solar Cells For STC Measurements
Jochen Hohl-Ebinger, Daniela Grote, Britta Hund, Wilhelm Warta
Improved Treatment of the Strongly Varying Slope in Fitting Solar Cell I-V Curves
A.R. Burgers, J.A. Eikelboom, A. Schonecker, W.C. Sinke
Measurement of Photovoltaic Device Current as a Function of Voltage, Temperature, Intensity and Spectrum
Keith Emery and Carl Osterwald
Solar Cell Efficiency Measurements
K.A. Emery and C.R. Osterwald
The Interactive Computer Program to Fit I-V Curves of Solar Cells
Tadeusz Zdanowicz
SURFACE QUALITY MONITORS
Application Note: Surface Preparation for Wire Bonding
David Jackson, CleanLogix
How Clean is Clean? Defining Acceptable Cleanliness Levels
Mantosh K. Chawla, Photo Emission Tech., Inc.
Using OSEE For Selecting Among Alternative Surface Cleanling Processes
Mantosh K. Chawla, Photo Emission Tech., Inc.
A Noncontacting Scanning Photoelectron Emission Technique for Bonding Surface Cleanliness Inspection
Dr. Raymond L. Gause, NASA Marshall Space Flight Center
Summary by Mantosh K. Chawla, Photo Emission Tech., Inc.
Pre-bond Quality Assurance of CFRP Surfaces Using Optically Stimulated Electron Emission
K. Brune, L. Lima, M. Noeske, K. Thiel, C. Tornow, S. Dieckhoff, M. Hoffmann, D. Stubing
Surface Analytical Approaches Contributing to Quality Assurance During Manufacture of Functional Interfaces
Kai Brune, Christian Tornow, Michael Noeske, Thorben Wiesner, André Felipe Queiroz Barbosa, Stephani Stamboroski, Stefan Dieckhoff, and Bernd Mayer
Bond Surface Evaluation by OSEE Instrument - Titan IV Payload Fairing
R. P. Date, The Aerospace Corporation
Contamination Detection on Weld Surfaces
Ron Blake, Martin Marietta
Contamination Monitoring of RSRM Bonding Surfaces using OSEE
Robert A. Mattes, Morton Thiokol, Inc.
Copper Foil Characterization and Cleanliness Testing
Irene Artaki et al, AT&T Bell Labs
Feasibility Study of OSEE Inspection for Flux Residue on Electronic Assemblies
Christopher S. Welch, College of William & Mary
How Clean is Clean? Non Destructive/Direct Methods of Flux Residue Detection
Mark Koch, Et Al, Sandia National Laboratories
Christopher S. Welch, College of William & Mary
Urmi Ray, AT&T Bell Laboratories
Measuring the Effectiveness of Magnetic Disk Cleaning and Cleaning Processes
John B. Mandle, John B. Mandle & Associates
Optically Stimulated Electron Emission (OSEE): A Non-Invasive Technique for Contamination Detection
George Epstein & Susan S. Shlanger, The Aerospace Corporation
OSEE Determination of Fluorocarbon Lubricant Film Thickness on Magnetic Thin Film Media
Khalid T. Mahmud, Nashua Computer Products Mantosh K. Chawla, Photo Emission Tech., Inc.
Improved Detection Technique For Solvent Rinse Cleanliness Verification
Dr. Steven J. Hornung, Honeywell Technology Solutions, Inc.
Steel Surface Oxidation after Pickling
Yume Gerenrot & David Leychkis, Ferrotech, Applied Research Center, Pittsburgh, PA
Surface Cleanliness Monitoring to Improve Coating/Paint Adhesion
Mantosh K. Chawla, Photo Emission Technology Inc.
Surface Quality Unit for Inspection by Non-Destructive Testing (SQUINT)
Tennyson Smith, Rockwell International Science Center
Testing Epoxy Composite Surfaces for Bondability
Brenda M. Parker, Materials and Structures Department, Royal Aerospace Establishment, UK Rex M. Waghorne, Fulmer Research, UK
The Evaluation of On-Line Performance Test Methods for Aqueous Cleaner for Metal Surface Finishing Process
Thomas M. Tam, Ralph Wyngarden & Anthony F. Naylor, Lockheed Corporation
The Use of Optically Stimulated Electron Emission for the Detection of Surface Contamination
C. J. Allen, C. Kerr & P. Walker, AWE, Aldermaston, Berkshire, England
SPECTRO RADIOMETERS
A Guide to Spectroradiometry